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Low Dose Imaging Using Simultaneous iDPC- and ADF-STEM for Beam Sensitive Crystalline Structures

Published online by Cambridge University Press:  01 August 2018

Anna Carlsson
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.
Ioannis Alexandrou
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.
Emrah Yücelen
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.
Eric G.T. Bosch
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.
Ivan Lazić
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Eindhoven, The Netherlands.

Abstract

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Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Lazić, I., Bosch, E.G.T. Lazar, S. Ultramicroscopy 160 2016 265280.Google Scholar
[2] Lazić, I. Bosch, E.G.T. Advances in Imaging and Electron Physics 199 2017 75184.Google Scholar
[3] Yucelen, E., Lazić, I. Bosch, E.G.T. Scientific Reports 8 2018 2676.Google Scholar
[4] Su, J., et al, Microporous and Mesoporous Materials 189 2014 115125.Google Scholar