9 results
X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers
-
- Journal:
- Powder Diffraction / Volume 28 / Issue 2 / June 2013
- Published online by Cambridge University Press:
- 19 April 2013, pp. 95-99
-
- Article
- Export citation
Grazing Incidence X-Ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometre Scale
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 332 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 525
- Print publication:
- 1994
-
- Article
- Export citation
Grazing Incidence X-Ray Characterization of Materials
-
- Journal:
- Advances in X-ray Analysis / Volume 36 / 1992
- Published online by Cambridge University Press:
- 06 March 2019, pp. 171-184
- Print publication:
- 1992
-
- Article
- Export citation
Distribution of Misfit Dislocations In SiGe on Si Measured with Synchrotron-Radiation Topography
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 221 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 363
- Print publication:
- 1991
-
- Article
- Export citation
Comparison of Synchrotron X-Ray Microanalysis with Electron and Proton Microscopy for Individual Particle Analysis
-
- Journal:
- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 1265-1273
- Print publication:
- 1991
-
- Article
- Export citation
Crystallinity of Isolated Silicon Epitaxy (ISE) Silicon-on-Insulator Layers
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 148 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 409
- Print publication:
- 1989
-
- Article
- Export citation
{224} Plane X-Ray Diffraction Study of GaAs on Si Wafers Using a Conventional Double Crystal Diffractometer
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 91 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 193
- Print publication:
- 1987
-
- Article
- Export citation
Characterization of Sub-Surface Structures by Double Crystal X-Ray Diffraction
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 82 / 1986
- Published online by Cambridge University Press:
- 26 February 2011, 447
- Print publication:
- 1986
-
- Article
- Export citation
Trace Element Analysis by Synchrotron Radiation Excited XRF
-
- Journal:
- Advances in X-ray Analysis / Volume 27 / 1983
- Published online by Cambridge University Press:
- 06 March 2019, pp. 557-562
- Print publication:
- 1983
-
- Article
- Export citation