10 results
Reliability studies of pentacene based thin film transistors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1435 / 2012
- Published online by Cambridge University Press:
- 11 July 2012, mrss12-1435-j06-19
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- 2012
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Doping of poly(3-hexylthiophene) nanofibers: microscopic morphology and electrical properties
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- Journal:
- The European Physical Journal - Applied Physics / Volume 46 / Issue 1 / April 2009
- Published online by Cambridge University Press:
- 10 March 2009, 12504
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- April 2009
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Performances of Sexithiophene Based Thin-Film Transistor Using Self-Assembled Monolayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 488 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 407
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- 1997
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Electrical Rectification by a Molecule of Hexadecylquinolinium Tricyanoquinodimethanide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 488 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 335
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- 1997
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Physical Characterization and Electrical Transport in End-Group Functionalized Self-Assembled Monolayers
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- MRS Online Proceedings Library Archive / Volume 488 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 847
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- 1997
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Organic Insulating Films at Nanometer Scale
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- Journal:
- MRS Online Proceedings Library Archive / Volume 446 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 79
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- 1996
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Improved Reliability With a New Plasma Nh3 Process for 0.35μιη P+ Poly-Gate Nitrided Oxide P-Mosfet's
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- Journal:
- MRS Online Proceedings Library Archive / Volume 446 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 91
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- 1996
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Bistable Defects Induced in GaAs by H2 Plasma Process
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- Journal:
- MRS Online Proceedings Library Archive / Volume 146 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 425
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- 1989
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Study of Spatial and Energetical Behavior of Slow Si-SiO2 Interface States By Tunnel-Dlts Under Fowler-Nordheim Stress
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- Journal:
- MRS Online Proceedings Library Archive / Volume 105 / 1987
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- 22 February 2011, 235
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- 1987
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Dlts Study of Oxide Traps Near the Si-SiO2 Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 54 / 1985
- Published online by Cambridge University Press:
- 26 February 2011, 587
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- 1985
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