6 results
Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue 4 / July 2000
- Published online by Cambridge University Press:
- 07 August 2002, pp. 329-334
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- July 2000
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Characterisation of Amorphous Materials By Electron Diffraction and Atomistic Modelling
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 684-685
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- August 1999
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Film/substrate interactions and superconducting properties of Tl(Ba1−xSrx)2Ca2Cu3Oy thin films on (001) SrTiO3 and SrTiO3-buffered (001) MgO substrates
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- Journal:
- Journal of Materials Research / Volume 13 / Issue 8 / August 1998
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2057-2066
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- August 1998
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A Comparison of Linear Scaling Tight Binding Methods
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- Journal:
- MRS Online Proceedings Library Archive / Volume 491 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 417
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- 1997
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Stm Imaging of Adsorbed Trimethylgallium on GaAs(001)-(2×4)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 312 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 219
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- 1993
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Properties of the Melt Processed 2212 Bscco in Silver
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- Journal:
- MRS Online Proceedings Library Archive / Volume 275 / 1992
- Published online by Cambridge University Press:
- 26 February 2011, 251
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- 1992
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