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Spectroscopic Ellipsometry Analysis of InGaN/GaN and AlGaN/GaN Heterostructures Using a Parametric Dielectric Function Model
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 775-781
- Print publication:
- 2000
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Spectroscopic Ellipsometry Analysis of InGaN/GaN and AlGaN/GaN Heterostructures Using a Parametric Dielectric Function Model
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W11.54
- Print publication:
- 1999
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Real-time Monitoring of semiconductor growth by Spectroscopic ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 502 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 3
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- 1997
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Spectroscopic Ellipsometry Study of HgCdTe Epilayer Surfaces During Electron Cyclotron Resonance Plasma Etching
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- Journal:
- MRS Online Proceedings Library Archive / Volume 450 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 293
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- 1996
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Ellipsometric Monitoring of Defects Induced by Electron Cyclotron Resonance Etching of GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 689
- Print publication:
- 1995
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In-Situ Spectroscopic Ellipsometry Applied to ZnSe and ZnCdSe Growth Process in Organometallic Vapor Phase Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 242 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 237
- Print publication:
- 1992
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Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 222 / 1991
- Published online by Cambridge University Press:
- 16 February 2011, 75
- Print publication:
- 1991
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