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TEM Sample Preparation of Buried Interfaces in Porous Layered Materials
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 3466-3467
- Print publication:
- August 2021
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A Method for FIB Liftout of Particles in Epoxy Resin
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 910-911
- Print publication:
- August 2019
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A Method for Plan-View FIB Liftout of Near Surface Defects with Minimal Beam-Induced Damage
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 842-843
- Print publication:
- August 2018
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