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TEM Sample Preparation of Buried Interfaces in Porous Layered Materials
Published online by Cambridge University Press: 30 July 2021
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- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Denisyuk, Andrey, Hrncir, Tomas, Sharang, Fozef Obona, Petrenec, Martin and Michalicka, Jan, Microscopy and Microanalysis Volume 23 Issue 3 (2017) p. 484 - 490CrossRefGoogle Scholar
Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.Google Scholar