10 results
Electrical Properties of Pd-contacted Single-walled Carbon Nanotubes: A Scanning Probe Microscopy Study
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1258 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1258-R10-19
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- 2010
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Texture and microtexture of copper films prepared by the self-ion assisted deposition technique on barrier layers with different structure
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- Journal:
- MRS Online Proceedings Library Archive / Volume 721 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, J3.5
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- 2002
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Electromigration properties of multigrain aluminum thin film conductors as influenced by grain boundary structure
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- Journal:
- Journal of Materials Research / Volume 16 / Issue 7 / July 2001
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2124-2129
- Print publication:
- July 2001
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Relationship Between Structure and Electromigration Characteristics of Pure Aluminum Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 369
- Print publication:
- 1997
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The Improvement of Immunity to Electromigration by Means of Microstructural Design
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 231
- Print publication:
- 1996
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Electromigration In Submicron Wide Copper Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 61
- Print publication:
- 1996
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Relationship Between The Void and Hillock Formation and The Grain Growth in Thin Aluminum Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 436 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 423
- Print publication:
- 1996
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Relationship Between The Void And Hillock Formation And The Grain Growth In Thin Aluminum Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 493
- Print publication:
- 1996
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Electromigration in Submicron Wide Copper Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 427 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 127
- Print publication:
- 1996
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Electromigration Behavior of Aluminum Films Deposited by Partially Ionized Beam.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 239 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 713
- Print publication:
- 1991
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