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Detailed Study of Electromigration Induced Damage in Al and AlCuSi Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 373
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- 1994
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Electromigration Damage in Conductor Lines: Recent Progress in Microscopic Observation and Mechanistic Modelling
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 397
- Print publication:
- 1994
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Electromigration Induced Resistance Changes in Passivated Aluminum Thin Film Conductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 301
- Print publication:
- 1993
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