2 results
Copper Oxide Edge-Termination for GaN Schottky Barrier Diodes with Low Turn-on Voltage
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1396 / 2012
- Published online by Cambridge University Press:
- 16 January 2012, mrsf11-1396-o04-05
- Print publication:
- 2012
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- Article
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Recent Reliability Progress of GaN HEMT Power Amplifiers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1432 / 2012
- Published online by Cambridge University Press:
- 17 May 2012, mrss12-1432-g08-06
- Print publication:
- 2012
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- Article
- Export citation