9 results
A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 412-413
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- August 2020
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An Optimized In-column Detection System for the Ultra-high Resolution BrightBeamTM SEM Column
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1806-1807
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- August 2020
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Technical Refinement of the Orage Ga-FIB column and Optimizing its Control for Routine Analytical Tasks
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 852-853
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- August 2018
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Mitigating Curtaining Artifacts During Ga FIB TEM Lamella Preparation of a 14 nm FinFET Device
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 3 / June 2017
- Published online by Cambridge University Press:
- 20 March 2017, pp. 484-490
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- June 2017
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Xe plasma FIB Delayering of IC based on 14 nm node technology
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 56-57
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- July 2016
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Curtaining-Free Top-Down TEM Lamella Preparation from a Cutting Edge Integrated Circuit
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 196-197
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- July 2016
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In-Situ EDS Characterization of TEM Lamellae Created by Xe Plasma FIB
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1405-1406
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- August 2015
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On the Calculation of SEM and FIB Beam Profiles
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- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 206-211
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- June 2015
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New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1104-1105
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- August 2014
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