3 results
Study of Stresses in Thin Silicon Wafers with Near-infraredphase Stepping Photoelasticity
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- Journal:
- Journal of Materials Research / Volume 17 / Issue 1 / January 2002
- Published online by Cambridge University Press:
- 31 January 2011, pp. 36-42
- Print publication:
- January 2002
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Nondestructive Measurement of In-Plane Residual Stress in Silicon Strips
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- Journal:
- MRS Online Proceedings Library Archive / Volume 591 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 283
- Print publication:
- 1999
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Finite Element Analysis of 2-D Dielectric Waveguides with Helmholtz Vector Equations and Virtual Exterior Elements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 579 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 281
- Print publication:
- 1999
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