6 results
How Low Can You Go: Pushing the Limits of Dose and Frame-time in the STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2218-2220
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- August 2022
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Improving the Noise Floor and Speed of Your Detector: A Modular Hardware Approach for Under $1000
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2904-2906
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- August 2022
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Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2486-2487
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- August 2022
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Using Your Beam Efficiently: Reducing Electron Dose in the STEM via Flyback Compensation
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 12 January 2022, pp. 1428-1436
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- August 2022
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Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 1 / February 2021
- Published online by Cambridge University Press:
- 18 December 2020, pp. 99-108
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- February 2021
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Retaining Precision at Low-dose and High-speed STEM Imaging Conditions
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2964-2966
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- August 2020
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