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How Low Can You Go: Pushing the Limits of Dose and Frame-time in the STEM

Published online by Cambridge University Press:  22 July 2022

Tiarnan Mullarkey ,
Jonathan J. P. Peters ,
Matthew Geever  and
Lewys Jones
Tiarnan Mullarkey*
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Centre for Doctoral Training in the Advanced Characterisation of Materials, AMBER Centre, Dublin, Ireland
Jonathan J. P. Peters
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland
Matthew Geever
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland
Lewys Jones
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures & Nanodevices (CRANN), Dublin, Ireland
*
*Corresponding author: mullarkt@tcd.ie

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2218 - 2220
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Copyright
Copyright © Microscopy Society of America 2022

References

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The authors would like to acknowledge the Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and the Advanced Materials and BioEngineering Research (AMBER) Network for financial and infrastructural support for this work. L.J. is supported by SFI award URF/RI/191637. J.J.P.P. and L.J. acknowledge SFI grant 19/FFP/6813, T.M. acknowledges the SFI & EPSRC Centre for Doctoral Training in the Advanced Characterisation of Materials (award references 18/EPSRC-CDT-3581 and EP/S023259/1) This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No 823717 – ESTEEM3.Google Scholar