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D086 High-Resolution Grazing Incidence In-Plane Diffraction in the Laboratory
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 173
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S213 Characterization of Strained Silicon on Insulator (sSOI) Substrates Using High-Resolution X-ray Diffraction
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
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Grazing incidence in-plane X-ray diffraction in the laboratory
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- Journal:
- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 45-48
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High Resolution X-ray Diffraction from Epitaxial Gallium Nitride Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 449 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 483
- Print publication:
- 1996
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