6 results
Dielectric Response of Light Emitting Semiconductor Junction Diodes: Frequency and Temperature Domain Study
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1635 / 2014
- Published online by Cambridge University Press:
- 17 February 2014, pp. 49-54
- Print publication:
- 2014
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Two-Step Capacitance Transients From an Oxygen Impurity Defect
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1066 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1066-A10-03
- Print publication:
- 2008
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Dependence of the Electronic Properties of Hot-Wire CVD Amorphous Silicon-Germanium Alloys on Oxygen Impurity Levels
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- Journal:
- MRS Online Proceedings Library Archive / Volume 989 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0989-A04-03
- Print publication:
- 2007
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The Effect of Oxygen Contamination on the Electronic Properties of Hot-Wire CVD Amorphous Silicon Germanium Alloys
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- Journal:
- MRS Online Proceedings Library Archive / Volume 910 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0910-A02-05
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- 2006
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Electronic Characterization and Light-Induced Degradation in nc-Si:H Solar Cells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 910 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0910-A01-05
- Print publication:
- 2006
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Electronic Properties of Improved Amorphous Silicon-Germanium Alloys Deposited by a Low Temperature Hot Wire Chemical Vapor Deposition Process
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- Journal:
- MRS Online Proceedings Library Archive / Volume 862 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, A7.2
- Print publication:
- 2005
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