2 results
Large Area and Depth-Profiling Dislocation Imaging and Strain Analysis in Si/SiGe/Si Heterostructures
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1521-1527
- Print publication:
- October 2014
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Structure of layered WSe2 thin films with ultralow thermal conductivity
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- Journal:
- Journal of Materials Research / Volume 23 / Issue 4 / April 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1064-1067
- Print publication:
- April 2008
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