10 results
Energy Tunability in Laboratory 3D Nano-XRM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 388-389
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- August 2019
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Development of a laboratory-based X-ray absorption system for energy material research
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2218-2219
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- August 2019
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Mapping Subsurface Composition with Attogram Sensitivity using Micro-XRF
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1058-1059
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- August 2018
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Advancements in X-Ray Analysis for Correlative Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 358-359
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- August 2018
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Novel sub-eV high throughput laboratory micro-XAS (x-ray absorption spectrometer) for chemical state analysis through XANES and EXAFS
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1008-1009
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- August 2018
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A New Approach to Microns-Resolution Trace Element and Mineralogy Mapping at PPM Sensitivity for Digital Rock and Geological Research
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2176-2177
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- July 2017
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Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 44-45
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- July 2017
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Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 118-119
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- July 2016
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Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 436-437
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- July 2016
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Low Coherence Interferometric Metrology for Ultra-thin MEMs Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 820 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, O8.8
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- 2004
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