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Characterization of Rapid Thermally Nitrided Titanium Films Contacting Silicided and Non-Silicided Junctions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 260 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 387
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- 1992
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The Effect of Polysilicon Doping (Using Ion Implantation or PBr3 Diffusion or Insitu Doping) on TiSi2 Formation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 260 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 207
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- 1992
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Comparative Studies of Gate Oxides Using Thermal, Stacked Gate, and Rapid Thermal Oxidation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 182 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 327
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- 1990
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Characterization of a Rapid Thermal Annealed TiNxOy/TiSi2 Barrier Layer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 181 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 527
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- 1990
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LA1BA2CU3O9-γ: Structural Analysis as Determined by Neutron Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 99 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 895
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- 1987
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