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A Correlative Atom-Probe Tomography and Transmission Electron Microscope Study of a Thermally Grown Oxide on a Commercial Nickel-Based Superalloy, René N'5 Y+®
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 966-967
- Print publication:
- August 2013
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In-Situ Tensile Observation of Deformation Twin in TWIP Steel Using TEM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 702-703
- Print publication:
- July 2009
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Characterization of TaN thin films synthesized by ICP assisted sputtering
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 330-331
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- August 2008
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Determination of Strain Relaxation at the Free Surfce of Strained-SiGe Film Using Convergent Beam Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1784-1785
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- August 2005
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Interfacial Reactions of Co and Si/Co Films on GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 337 / 1994
- Published online by Cambridge University Press:
- 25 February 2011, 337
- Print publication:
- 1994
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