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3D Finite Element Simulation from Non-destructive X-ray Tomography and Verification with Novel Mechanical Testing and Digital Image Correlation In-situ of Focused Beam Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3104-3108
- Print publication:
- August 2020
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Correlative 3D X-Ray, Laser Ablation, and SEM/EDS Mapping Establishing Access Point for FIB Tomography of Defects in Multi-Layer Ceramic Capacitors
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 344-345
- Print publication:
- August 2019
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