Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-07-02T09:24:34.747Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative 3D X-Ray, Laser Ablation, and SEM/EDS Mapping Establishing Access Point for FIB Tomography of Defects in Multi-Layer Ceramic Capacitors

Published online by Cambridge University Press:  05 August 2019

J Favata ,
V Ray  and
S Shahbazmohamadi
J Favata
Affiliation:
REFINE Lab, University of Connecticut, 159 Discovery Dr. Storrs, CT, USA.
V Ray
Affiliation:
REFINE Lab, University of Connecticut, 159 Discovery Dr. Storrs, CT, USA.
S Shahbazmohamadi
Affiliation:
REFINE Lab, University of Connecticut, 159 Discovery Dr. Storrs, CT, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 344 - 345
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ho, J et al. , IEEE Electrical Insulation Magazine. 26 (2010), p. 20.Google Scholar
[2]O'Malley, P et al. , 55th Annual NDIA Fuze Conference (2011), p. 269.Google Scholar
[3]Favata, J et al. , Microscopy & Microanalysis 24 (2018), p. 362.Google Scholar