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Extending the Use of NO Dielectrics for DRAM by Ultrathin Silicon Nitride RTCVD with In Situ Ammonia and Hydrogen Pre-Deposition Surface Conditioning
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- Journal:
- MRS Online Proceedings Library Archive / Volume 470 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 387
- Print publication:
- 1997
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- Article
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Effects of A.C. Stress on Charge and Voltage Decay Rates of PZT Thin Film Capacitors for DRAM Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 361 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 263
- Print publication:
- 1994
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- Article
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