15 results
Bulge Testing for Strength Metrics of Detector X-Ray Windows
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2005-2006
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
An Improved Low Energy X-ray Transmission Window
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1316-1317
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer Substrates
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 638-639
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Comparison of Simulated and Experimental Order Parameters in FePt—II
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 3 / June 2011
- Published online by Cambridge University Press:
- 15 April 2011, pp. 403-409
- Print publication:
- June 2011
-
- Article
- Export citation
Dynamical Diffraction Simulations in FePt—I
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 3 / June 2011
- Published online by Cambridge University Press:
- 15 April 2011, pp. 398-402
- Print publication:
- June 2011
-
- Article
- Export citation
The Blind Men and the Elephant as a Metaphor for Surface Analysis, as Applied to the Preparation and Analysis of New, Highly Stable Materials for Separations Science
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 410-411
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Design and Construction of an Underground TEM Lab at Brigham Young University
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 892-893
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Radiolytic Transformation of TiO2 Revisited with High Resolution EELS
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1438-1439
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Convergent Beam Electron Diffraction of Ordered L10 Nanoparticles
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 782-783
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Diffusion of Ion Implanted Elements in Silicon by TEM And SIMS
-
- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1082-1083
- Print publication:
- August 2000
-
- Article
- Export citation
Effective Extinction Distances in Zone Axis Silicon
-
- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1028-1029
- Print publication:
- August 2000
-
- Article
- Export citation
A Stem Study Of A Germanium Island-Silicon Interface
-
- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 126-127
- Print publication:
- August 1999
-
- Article
- Export citation
Atomic-Scale Imaging of Dopant Atom Distributions Within Silicon δ-Doped Layers
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 589 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 173
- Print publication:
- 1999
-
- Article
- Export citation
Prospects For Imaging of Single Dopant Atoms in Silicon by ADF Stem
-
- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 646-647
- Print publication:
- July 1998
-
- Article
- Export citation
Electron Beam Driven Disordering in Small Particles
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 439 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 685
- Print publication:
- 1996
-
- Article
- Export citation