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Clinical Depression: is Treatment Outcome Impacted by Comorbid Depressive Personality?
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- Journal:
- European Psychiatry / Volume 30 / Issue S1 / March 2015
- Published online by Cambridge University Press:
- 15 April 2020, p. 1
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EPA-0426 – Mood and Global Symptom Changes Among Psychotherapy Outpatients with Depressive Personality Disorder
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- European Psychiatry / Volume 29 / Issue S1 / 2014
- Published online by Cambridge University Press:
- 15 April 2020, p. 1
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Paul Erdőos, Vance Faber, and Jean Larson Sets of natural numbers of positive density and cylindric set algebras of dimension 2. Algebra universalis, vol. 12 (1981), pp. 81–92. - Jean A. Larson The number of one-generated diagonal-free cylindric set algebras of finite dimension greater than two. Algebra universalis, vol. 16 (1983), pp. 1–16. - Jean A. Larson The number of finitely generated infinite cylindric set algebras of dimension two. Algebra universalis, vol. 19 (1984), pp. 377–396. - Jean A. Larson The number of one-generated cylindric set algebras of dimension greater than two. The journal of symbolic logic, vol. 50 (1985), pp. 59–71.
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- Journal:
- Bulletin of Symbolic Logic / Volume 7 / Issue 2 / June 2001
- Published online by Cambridge University Press:
- 05 July 2016, pp. 281-283
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- June 2001
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10 - The Endangered Species Act and Critical Habitat Designation: Economic Consequences for the Colorado River Basin
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- Protecting Endangered Species in the United States
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- 06 July 2010
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- 21 May 2001, pp 177-199
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Loans and Legitimacy: The Evolution of Soviet-American Relations, 1919-1933. By Katherine A. S. Siegel. Lexington: University Press of Kentucky, 1996. x, 212 pp. Notes. Bibliography. Index. Photographs. $39.95, hard bound.
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- Journal:
- Slavic Review / Volume 56 / Issue 4 / Winter 1997
- Published online by Cambridge University Press:
- 27 January 2017, pp. 785-786
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- Winter 1997
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Stress Induced Increased Low Level Leakage in Thin Oxides*
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- MRS Online Proceedings Library Archive / Volume 284 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 319
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- 1992
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Measurement of High Voltage Stress Induced Traps Inside Thin Silicon Oxide Films***
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- MRS Online Proceedings Library Archive / Volume 284 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 247
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- 1992
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