22 results
Element Analysis by EDX for Life Science: Light Elements and Bio-Mineralization
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 222-223
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- August 2013
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Microanalysis Software: Properties and Requirements
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 834-835
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- August 2013
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Effect of the Absorption on the Shape of the Emitted φ(ρz) Depth Distribution for Accurate Quantitative Microanalysis: Evaluation of Analytical Models and Monte Carlo Programs
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 850-851
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- August 2013
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Characterization of a Microcalorimeter in comparison to Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1060-1061
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- July 2012
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EDS Spectrometry at Low Accelerating Voltages: Pushing the Boundaries of Nano- and Light Element Analysis with Enhanced SDD Technology
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1064-1065
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- July 2012
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A Microcalorimeter Spectrometer for High-Resolution X-ray Microanalysis
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1228-1229
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- July 2012
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SDD-EDS: Element Analysis of Nanostructures in TEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1058-1059
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- July 2012
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High Speed, High Resolution and Large Area X-ray Imaging Using Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 892-893
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- July 2011
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Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 600-601
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- July 2011
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Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1170-1171
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- July 2011
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Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1200-1201
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- July 2011
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Nanoanalysis in SEM and STEM: EDS Using Silicon Drift Detectors in Comparison to EELS Using Cs-Corrected STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 936-937
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- July 2010
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Applications Using an Annular Four-Channel Silicon Drift Detector
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1302-1303
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- July 2010
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High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1314-1315
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- July 2010
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Element Distribution in Novel Hedgehog-Like Magnetic Nanostructures Studied by, Cs-Corrected STEM-EELS and Uncorrected STEM-XEDS Using SDD-Technology
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1214-1215
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- July 2009
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XEDS with SDD-Technology in Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 202-203
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- July 2009
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Characterization of an Annular Four-channel Silicon Drift Detector with a Light Element Window
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 206-207
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- July 2009
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Advances in the technology of silicon drift detectors (SDD) and multiple element SDD
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1166-1167
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- August 2008
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The Energies and Relative Intensities of L and M lines in the Low-energy Range
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1404-1405
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- August 2007
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Advanced High-Energy Resolution Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1408-1409
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- August 2006
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