3 results
Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 490-493
- Print publication:
- August 2020
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An informatics software stack for point defect-derived opto-electronic properties: the Asphalt Project
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- Journal:
- MRS Communications / Volume 9 / Issue 3 / September 2019
- Published online by Cambridge University Press:
- 02 September 2019, pp. 839-845
- Print publication:
- September 2019
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Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1596-1597
- Print publication:
- July 2017
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