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Microscopy and Microanalysis Microscopy and Microanalysis

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Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide

Published online by Cambridge University Press:  04 August 2017

Weizong Xu ,
Preston C. Bowes ,
Everett D. Grimley ,
Douglas L. Irving  and
James M. LeBeau
Weizong Xu
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA
Preston C. Bowes
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA
Everett D. Grimley
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA
Douglas L. Irving
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695, USA
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Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1596 - 1597
Copyright
© Microscopy Society of America 2017 

References

[1] Enterkin, J, et al, Nature Materials 9 2010). p. 245.Google Scholar
[2] Xu, W, et al, Applied Physics Letters 109 2016). p. 201601.CrossRefGoogle Scholar
[3] Xu, W, et al, Microscopy and Microanalysis 22 2016). p. 774.CrossRefGoogle Scholar
[4] Kotula, P, Keenan, M & Michael, J Microscopy and Microanalysis 9 2003). p. 1.CrossRefGoogle Scholar
[5] The authors thank the support from the National Science Foundation (NsF) (DMR-1350273, DMR-1151568), the Air Force Office of Scientific Research (FA9550-14-1-0182) and AIF at NCSU.Google Scholar
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Utilizing High-temperature Atomic-resolution STEM and EELS to Determine Reconstructed Surface Structure of Complex Oxide
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