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Bootstrap approach for conformance assessment of measurement processes
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- Journal:
- International Journal of Metrology and Quality Engineering / Volume 2 / Issue 1 / 2011
- Published online by Cambridge University Press:
- 29 June 2011, pp. 19-24
- Print publication:
- 2011
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Mechanisms of Stacking Fault Growth in SiC PiN Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 815 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, J6.4
- Print publication:
- 2004
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- Article
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MeV Boron Implantation and Masking
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- Journal:
- MRS Online Proceedings Library Archive / Volume 316 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 361
- Print publication:
- 1993
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Phosphorus Diffusion in Polycrystalline Silicon: Monte Carlo Simulation of Experimental Diffusion Profiles
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- Journal:
- MRS Online Proceedings Library Archive / Volume 106 / 1987
- Published online by Cambridge University Press:
- 22 February 2011, 39
- Print publication:
- 1987
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