35 results
Applications of Low Dose Electron Ptychography.
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 352-354
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- August 2022
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Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 488-489
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- August 2018
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Exploring the Limits of Focused-Probe STEM Ptychography
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 190-191
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- August 2018
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Evaluation of Aberration-corrected Optical Sectioning for Exploring the Core Structure of ½[111] Screw Dislocations in BCC Metals
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 432-433
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- July 2017
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Using Advanced STEM Techniques to Unravel Key Issues in the Development of Next-Generation Nanostructures for Energy Storage
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 1698-1699
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- July 2017
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Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 508-509
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- July 2016
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The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 466-467
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- July 2016
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Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 896-897
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- July 2016
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The Design and Performance of a Double Wien Filter Monochromator for Application in TEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 310-311
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- August 2013
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Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 532-533
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- July 2012
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STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1842-1843
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- July 2012
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Atomic resolution imaging of 2D nanomaterials
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1524-1525
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- July 2012
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Energy-Filtered Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1962-1963
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- July 2012
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Effect Of The Eshelby-Stroh Twist In Dislocations In GaN Imaged End-On
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1338-1339
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- July 2012
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Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1836-1837
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- July 2010
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Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1888-1889
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- July 2010
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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1834-1835
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- July 2010
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Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 42-43
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- July 2009
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Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 2130-2131
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- August 2005
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An Aberration-Corrected STEM for Diffraction Studies
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 544-545
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- August 2005
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