Hostname: page-component-5c6d5d7d68-wpx84 Total loading time: 0 Render date: 2024-08-18T13:37:57.366Z Has data issue: false hasContentIssue false
  • English
  • Français

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Published online by Cambridge University Press:  01 August 2010

A Hashimoto ,
P Wang ,
M Shimojo ,
K Mitsuishi ,
AI Kirkland ,
PD Nellist  and
M Takeguchi
A Hashimoto
Affiliation:
National Institute for Materials Science, Japan
P Wang
Affiliation:
University of Oxford, United Kingdom
M Shimojo
Affiliation:
National Institute for Materials Science, Japan
K Mitsuishi
Affiliation:
National Institute for Materials Science, Japan
AI Kirkland
Affiliation:
University of Oxford, United Kingdom
PD Nellist
Affiliation:
University of Oxford, United Kingdom
M Takeguchi
Affiliation:
National Institute for Materials Science, Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1888 - 1889
Copyright
Copyright © Microscopy Society of America 2010