12 results
Advances in STEM and EELS: New Operation Modes, Detectors and Software
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 512-513
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
STEM-EDXS System for Atomic-Sensitivity Elemental Mapping
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 339-340
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1427-1428
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 558-559
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Exploring Phonon Signals by High Energy / High Spatial Resolution EELS
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 66-67
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Improving the Spatial Resolution of Low-keV STEM with a Monochromator
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 312-313
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
High Energy Resolution Monochromated EELS-STEM System
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1124-1125
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Exploring new frontiers with the Nion aberration-corrected STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1278-1279
- Print publication:
- July 2012
-
- Article
- Export citation
Improving the Spatial and Energy Resolution of Aberration-Corrected STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1290-1291
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Dedicated STEM for 200 to 40 keV operation*
-
- Journal:
- The European Physical Journal - Applied Physics / Volume 54 / Issue 3 / June 2011
- Published online by Cambridge University Press:
- 13 June 2011, 33505
- Print publication:
- June 2011
-
- Article
-
- You have access
- Open access
- Export citation
Aberration-Corrected STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1462-1463
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1422-1423
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation