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Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces
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- Journal:
- Journal of Materials Research / Volume 1 / Issue 3 / June 1986
- Published online by Cambridge University Press:
- 31 January 2011, pp. 468-475
- Print publication:
- June 1986
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RAMAN SCATTERING AND X-RAY DIFFRACTION CHARACTERIZATION OF AMORPHOUS SEMICONDUCTOR MULTILAYER INTERFACES
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- Journal:
- MRS Online Proceedings Library Archive / Volume 56 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 389
- Print publication:
- 1985
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