6 results
Principles and Performance of a PC-Based Program for Simulation of Double-Axis X-Ray Rocking Curves of Thin Epitaxial Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 208 / 1990
- Published online by Cambridge University Press:
- 22 February 2011, 113
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- 1990
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The Performance of Channel Cut Collimators for Precision X-Ray Diffraction Studies of Epitaxial Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 208 / 1990
- Published online by Cambridge University Press:
- 22 February 2011, 107
- Print publication:
- 1990
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Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 208 / 1990
- Published online by Cambridge University Press:
- 22 February 2011, 119
- Print publication:
- 1990
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X-Ray Reflectometry from Semiconductor Surfaces and Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 208 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 345
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- 1990
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The Contrast of Dislocations in X-Ray Topographs of Homogeneously Bent Silicon Crystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 82 / 1986
- Published online by Cambridge University Press:
- 26 February 2011, 209
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- 1986
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X-Ray Double Crystal Topography of Processed Silicon Wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 82 / 1986
- Published online by Cambridge University Press:
- 26 February 2011, 215
- Print publication:
- 1986
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