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Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1762-1763
- Print publication:
- August 2013
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- Article
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Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 690-691
- Print publication:
- July 2012
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