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Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques

Published online by Cambridge University Press:  09 October 2013

S. Zaefferer ,
N.-N. Elhami ,
P. Konijnenberg  and
T. Jäpel
S. Zaefferer
Affiliation:
N.-N. Elhami
Affiliation:
P. Konijnenberg
Affiliation:
T. Jäpel
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1762 - 1763
Copyright
Copyright © Microscopy Society of America 2013