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Computational Method for Composition Determination of Multilayer Epitaxial Semiconductor Structures Using Standards-Based Energy-Dispersive X-Ray Spectrometry
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1085-1086
- Print publication:
- August 2015
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A Standards-Based Method for Compositional Analysis by Energy Dispersive X-Ray Spectrometry Using Multivariate Statistical Analysis: Application to Multicomponent Alloys
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue 1 / February 2013
- Published online by Cambridge University Press:
- 08 January 2013, pp. 66-72
- Print publication:
- February 2013
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Effect of active layer morphology on recombination mechanism in polymer: fullerene organic bulk heterojunction solar cells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1390 / 2012
- Published online by Cambridge University Press:
- 18 April 2012, mrsf11-1390-i02-03
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- 2012
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