6 results
Robotic Fabrication of High-quality Lamellae for Aberration-corrected Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 54-56
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- August 2022
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Ultrastructure of the Gas Vesicle Protein Shell
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, p. 1112
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- August 2022
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SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 408-409
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- August 2020
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In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 548-549
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- August 2019
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Ar+ FIB Milling and Measurement of FIB Damage in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 886-887
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- August 2019
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Latest Developments in Multiple Ion Species Plasma FIB Technology
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 570-571
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- August 2019
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