Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-25T08:26:45.107Z Has data issue: false hasContentIssue false

Robotic Fabrication of High-quality Lamellae for Aberration-corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Mikhail Dutka
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
Brandon Van Leer
Affiliation:
Thermo Fisher Scientific, Hillsboro, OR, USA
Hideyo Tsurusawa*
Affiliation:
Thermo Fisher Scientific, FEI Japan Ltd., Shinagawa-ku, Tokyo, Japan
Nobuto Nakanishi
Affiliation:
Thermo Fisher Scientific, FEI Japan Ltd., Shinagawa-ku, Tokyo, Japan
Kayoko Kawano
Affiliation:
Thermo Fisher Scientific, FEI Japan Ltd., Shinagawa-ku, Tokyo, Japan
Yiquiang Cheng
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
Teruyasu Mizoguchi*
Affiliation:
Institute of Industrial Science, University of Tokyo, Meguro-ku, Tokyo, Japan

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Copyright
Copyright © Microscopy Society of America 2022

References

Mayer, J., Giannuzzi, L. A., Kamino, T. & Michael, J, MRS Bull. 32, 400407 (2007).10.1557/mrs2007.63CrossRefGoogle Scholar
Schaffer, M., Schaffer, B. & Ramasse, Q. Ultramicroscopy 114, 6271 (2012).10.1016/j.ultramic.2012.01.005CrossRefGoogle Scholar
Van Leer, B. et al. Micros. Today 26, 1825 (2018).10.1017/S1551929517001195CrossRefGoogle Scholar
Tsurusawa, H., Nakanishi, N., Kawano, K. et al. Sci. Rep. 11, 21599 (2021). https://doi.org/10.1038/s41598-021-00595-xCrossRefGoogle Scholar