1 results
In-situ TEM Analyses over FIB Lamellae - Investigating High Temperature Conversion of Solution Processed Mo-precursor to MoS2 Semiconductor Films.
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 258-259
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation