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In-situ TEM Analyses over FIB Lamellae - Investigating High Temperature Conversion of Solution Processed Mo-precursor to MoS2 Semiconductor Films.

Published online by Cambridge University Press:  04 August 2017

Anuj Pokle ,
Megan Canavan ,
Dermot Daly ,
Francis Oliver Vinay Gomes ,
Marko Marinkovic ,
Veit Wagner  and
Valeria Nicolosi
Anuj Pokle
Affiliation:
School of Physics, Trinity College Dublin, Dublin 2, Ireland Advance Microscopy Lab, Trinity College Dublin, Dublin 2, Ireland
Megan Canavan
Affiliation:
School of Physics, Trinity College Dublin, Dublin 2, Ireland Advance Microscopy Lab, Trinity College Dublin, Dublin 2, Ireland
Dermot Daly
Affiliation:
Advance Microscopy Lab, Trinity College Dublin, Dublin 2, Ireland
Francis Oliver Vinay Gomes
Affiliation:
Evonik Resource Efficiency GmbH, Paul-Baumann-Strasse 1, 45764 Marl, Germany Jacobs University Bremen, Department of Physics & Earth Science, Campus Ring 1, 28759 Bremen, Germany
Veit Wagner
Affiliation:
Jacobs University Bremen, Department of Physics & Earth Science, Campus Ring 1, 28759 Bremen, Germany
Valeria Nicolosi
Affiliation:
School of Chemistry, Trinity College Dublin, Dublin 2, Ireland CRANN, Trinity College Dublin, Dublin 2, Ireland

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 258 - 259
Copyright
© Microscopy Society of America 2017 

References

[1] Novoselov, K. S., et al, Proc. Natl. Acad. Sci. U. S. A. 102 2005). p. 10451.CrossRefGoogle Scholar
[2] Coleman, J. N., et al, Science 331 2011). p. 568.CrossRefGoogle Scholar
[3] Kang, K., et al, Nature 520 2015). p. 656.Google Scholar
[4] The authors would like to acknowledge support from the European Research Council, the Marie Curie FP7 ITN MoWSeS project, the SFI PIYRA, CRANN/AMBER Centre and the Advance Microscopy Lab-Dublin.Google Scholar