6 results
Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 74-75
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- July 2010
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Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 70-71
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- July 2010
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Revealing Electronic, Structural and Magnetic Phases in NdFeAsO with Electron Energy-Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 88-89
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- July 2010
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Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 76-77
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- July 2010
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Atomic Resolution Z-Contrast Imaging of the Interface Between Non-Polar a-ZnO Grown on r-Cut Al2O3 by Pulsed Laser Deposition
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 154-155
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- July 2010
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Imaging Non-stoichiometric Dislocation Cores in Alumina
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1174-1175
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- August 2007
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