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Local Phase Curvature Measurement in STEM With a Pixelated Detector
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 82-83
- Print publication:
- August 2019
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Tuning STEM: Tailoring the Incident Probe, Scattering Dynamics and Detector Geometry for Maximum Specimen Information
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 174-175
- Print publication:
- August 2018
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