Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T15:13:34.563Z Has data issue: false hasContentIssue false
  • English
  • Français

Tuning STEM: Tailoring the Incident Probe, Scattering Dynamics and Detector Geometry for Maximum Specimen Information

Published online by Cambridge University Press:  01 August 2018

J. Etheridge ,
W. Chao ,
E. Drath Bøjesen ,
Y. Guo ,
M. Krajnak ,
W. Li  and
C. L. Zheng
J. Etheridge
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC3800, Australia Department of Materials Science and Engineering, Monash University, VIC3800, Australia
W. Chao
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
E. Drath Bøjesen
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC3800, Australia
Y. Guo
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
M. Krajnak
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
W. Li
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
C. L. Zheng
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC3800, Australia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 174 - 175
Copyright
© Microscopy Society of America 2018 

References

[1] Uchida, M. Tonomura, A. Nature 464 2010) p. 737.Google Scholar
[2] Verbeeck, J., Tian, H. Schattschneider, P. Nature 467 2010) p. 301.Google Scholar
[3] McMorran, B. J., et al, Science 331 2011) p. 192.Google Scholar
[4] Zheng, C. L., Petersen, T. C., Kirmse, H., Neumann, W., Morgan, M. F. Etheridge, J. Phys Rev Lett 119 2017 174801.Google Scholar
[5] Nakashima, P. H., Moodie, A. F. Etheridge, J. PNAS 110 2013) p. 14144.Google Scholar
[6] Nguyen, D. T., Findlay, S. D. Etheridge, J. Ultramicroscopy 184 2018) p. 143.Google Scholar
[7] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[8] The authors acknowledge funding from the Australian Research Council grants DP150104483, DP160104679 and LE0454166.Google Scholar