8 results
Electron Microscopy Analysis of Grain Boundary Corrosion in Ni-Cr Binary Alloys Exposed to High Temperature Hydrogenated Water
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1175-1176
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- August 2015
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Site Specific Focused Ion Beam (FIB) Sample Preparation of Penetrative Oxidation in Ni-Base Alloys for 3DAPT Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 678-679
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- July 2011
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Resolving Nanostructures in Complex Penetrative Oxidation for Ni-30Cr Alloys Exposed to High-Temperature Water using APT and TEM
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 734-735
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- July 2011
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Fluctuation Electron Microscopy Investigation of Anodic Ta2O5 and Nb2O5 Dielectrics
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1002-1003
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- August 2007
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Field-Induced Crystallization of Anodized Nb and NbO Electrolytic Capacitors
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 810-811
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- August 2007
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TEM and EELS Analysis of Anodized Nb2O5: Stoichiometry and Field-Induced Crystallization
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1194-1195
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- August 2006
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Focused Ion Beam (FIB) Preparation and Electron Microscopy Analysis of Individual Microbolometer Pixels
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1270-1271
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- August 2006
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Interfaces in Next Generation Ta and NbO Solid Electrolytic Capacitors
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 578-579
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- August 2005
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