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Focused Ion Beam (FIB) Preparation and Electron Microscopy Analysis of Individual Microbolometer Pixels

Published online by Cambridge University Press:  31 July 2006

M Olszta ,
J Dougherty ,
M Horn  and
EC Dickey
M Olszta
Affiliation:
Pennsylvania State University
J Dougherty
Affiliation:
Pennsylvania State University
M Horn
Affiliation:
Pennsylvania State University
EC Dickey
Affiliation:
Pennsylvania State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1270 - 1271
Copyright
© 2006 Microscopy Society of America