3 results
Expanding Capabilities of Low-kV STEM Imaging and Transmission Electron Diffraction in FIB/SEM Systems
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 554-555
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Helios G4: Pushing the Limits of TEM Sample Preparation and STEM Resolution
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 30-31
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Selective Detection of Backscattered Electrons in the Compound Lens Equipped UHR SEM
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 576-577
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation