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High-accuracy electron tomography of semiconductor devices
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1609-1610
- Print publication:
- August 2015
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Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
- Published online by Cambridge University Press:
- 02 July 2010, pp. 416-424
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- August 2010
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Epitaxial thin films of multiferroic Bi2FeCrO6 with B-site cationic order
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- Journal:
- Journal of Materials Research / Volume 22 / Issue 8 / August 2007
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2102-2110
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- August 2007
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