4 results
Material Reliability of Low-Temperature Boron Deposition for PureB Silicon Photodiode Fabrication
-
- Journal:
- MRS Advances / Volume 3 / Issue 57-58 / 2018
- Published online by Cambridge University Press:
- 26 June 2018, pp. 3397-3402
- Print publication:
- 2018
-
- Article
- Export citation
Electrical Characterization of Residual Implantation-Induced Defects in the Vicinity of Laser-Annealed Implanted Ultrashallow Junctions
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 912 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0912-C05-02
- Print publication:
- 2006
-
- Article
- Export citation
Si1−xGex Island Formation by Post-Growth Anneal on Supercritical Layers Grown by RPCVD
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 618 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, 129
- Print publication:
- 2000
-
- Article
- Export citation
A Low-Cost BiCMOS Process with Metal Gates
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 611 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, C7.2.1
- Print publication:
- 2000
-
- Article
- Export citation