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Improving the Depth Resolution of HAADF Sectioning by 3D Deconvolution
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3110-3111
- Print publication:
- August 2020
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Precise Measurement of Carrier Concentrations in n-Type GaN by Phase-Shifting Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 50-51
- Print publication:
- August 2019
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Development and Application of an Internet Electron Microscopy System for the Outreach Program in Japan
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 2 / April 2008
- Published online by Cambridge University Press:
- 03 March 2008, pp. 176-183
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- April 2008
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Growth of ZnO Thin Films on Sapphire Substrates by ECR-Assisted MBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 474 / 1997
- Published online by Cambridge University Press:
- 15 February 2011, 395
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- 1997
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High Resolution Transmission Electron Microscopy of Defect Clusters in Aluminum During Electron and Ion Irradiation at Room Temperature
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- Journal:
- MRS Online Proceedings Library Archive / Volume 439 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 331
- Print publication:
- 1996
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